S. R. Cantrell, A. V. Mamishev, and M. Zahn, “Uncertainty Analysis for Multiple Penetration Depth Dielectrometry,” in International Conference on Advances in Processing, Testing and Application of Dielectric Materials, (Wroclaw, Poland), pp. 119-122, Sep. 2001
B. C. Lesieutre, A. V. Mamishev, Y. Du, E. Keskiner, M. Zahn, and G. C. Verghese, “Forward and Inverse Parameter Estimation Algorithms of Interdigital Dielectrometry Sensors,” IEEE Transactions on Dielectrics and Electrical Insulation, vol. 8, pp. 577-588, Aug. 2001.
21st April 2017A. V. Mamishev, Y. Du, J. H. Bau, B. C. Lesieutre, and M.Zahn, “Evaluation of Diffusion-Driven Material Property Profiles Using Three-Wavelength Interdigital Sensor,” IEEE Transactions on Dielectrics and Electrical Insulation, vol. 8, pp. 785-798, Oct. 2001.
21st April 2017S. R. Cantrell, A. V. Mamishev, and M. Zahn, “Uncertainty Analysis for Multiple Penetration Depth Dielectrometry,” in International Conference on Advances in Processing, Testing and Application of Dielectric Materials, (Wroclaw, Poland), pp. 119-122, Sep. 2001
S. R. Cantrell, A. V. Mamishev, and M. Zahn, “Uncertainty Analysis for Multiple Penetration Depth Dielectrometry,” in International Conference on Advances in Processing, Testing and Application of Dielectric Materials, (Wroclaw, Poland), pp. 119-122, Sep. 2001
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