Mamishev, A.; Zahn, M., Techniques for semi-empirical characterization of material and sensor properties in interdigital dielectrometry, Electrical Insulation, 1996., Conference Record of the 1996 IEEE International Symposium on , Volume: 2 , 1996 Page(s): 486 -489 vol.2

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9. Mamishev, A.; Zahn, M., Techniques for semi-empirical characterization of material and sensor properties in interdigital dielectrometry, Electrical Insulation, 1996., Conference Record of the 1996 IEEE International Symposium on , Volume: 2 , 1996 Page(s): 486 -489 vol.2

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Mamishev, A.; Zahn, M., Techniques for semi-empirical characterization of material and sensor properties in interdigital dielectrometry, Electrical Insulation, 1996., Conference Record of the 1996 IEEE International Symposium on , Volume: 2 , 1996 Page(s): 486 -489 vol.2

Du, Y.; Zahn, M.; Mamishev, A.V.; Schlicker, D.E., Moisture dynamic measurements of transformer board using a three-wavelength dielectrometry sensor, Electrical Insulation, 1996., Conference Record of the 1996 IEEE International Symposium on , Volume: 1 , 1996 Page(s): 53 -56 vol.1

F. Yang, N. E. Jewell-Larsen, D. L. Brown, K. Pendergrass, D. A. Parker, I. A. Krichtafovitch, A. V. Mamishev, “Corona driven air propulsion for cooling of electronics.” International Symposium on High Voltage Engineering, Delft Netherlands , 2003.

Mamishev, A.; Zahn, M., Techniques for semi-empirical characterization of material and sensor properties in interdigital dielectrometry, Electrical Insulation, 1996., Conference Record of the 1996 IEEE International Symposium on , Volume: 2 , 1996 Page(s): 486 -489 vol.2

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Mamishev, A.V.; Du, Y.; Lin, C.; Lesieutre, B.C.; Zahn, M., One-sided measurement of material dielectric properties using a liquid dielectric immersion technique, Dielectric Liquids, 1999. (ICDL ’99). Proceedings of the 1999 IEEE 13th International Conference on , 1999 Page(s): 341 -344

A. V. Mamishev, C. Lin, Y. Du, B.C. Lesieutre, and M. Zahn, ” Improvement of algorithms for on-line interdigital dielectrometry measurement of material properties,” IEEE International Symposium on Electrical Insulation, Volume 2 , 1998, pp. 444 -447.